AN191 GD32 MCU Hardware Layout Design Reference

1.0

none

2024-10-17

Introduction：AN191 Introduces the Precautions to be Taken in the Hardware Layout of the GD32 MCU.

AN181 I2C Noise Filters and Related Hold and Setup Times

1.0

none

2024-10-17

Introduction：AN181 introduces the I2C noise filter of the GD32 MCU and the calculation of related hold and setup times.

AN092 GD32 MCU GPIO Structure and Precautions

1.4

2024-09-26

Introduction：AN092 is designed for engineering designers based on GD32 MCU development, and mainly introduces the functional configuration of GPIO, the internal structure, and the precautions when using in different scenarios

AN192 GD32 MCU Spreading Frequency Test Operation Guide

1.1

none

2024-07-11

Introduction：AN192 describes how to use GD32 MCU for spreading frequency testing, and uses GD32F470 as an example to introduce the relevant operation steps and their impact.

AN095 Methods to Improve the Accuracy of the GD32 Temperature Sensor

1.2

2024-06-04

Introduction：AN95 aims to guide customers on ways to improve the accuracy of GD32 MCU temperature sensors.

AN163 GD32 MCU EMC Hardware Protection Design Reference

1.0

2024-03-27

Introduction：AN163 provides some EMC protection design references for MCU hardware design, aiming to help optimize the EMC performance of MCU in the product application process.

AN142 EMC Design Technology for Drivers and Motors

1.0

none

2023-10-30

Introduction：AN142 introduces the sources and some improvement methods of EMC in motors and their drive systems, helping users quickly understand and optimize key circuits in the drive system.

AN164 Porting Guide of Dhrystone based on GD32 MCU

1.0

none

2023-10-30

Introduction：AN164 introduces the principle of Dhrystone and the porting method on GD32 MCU.

AN125 IEC61967-2 Chip-Level RE Test

1.0

2023-09-26

Introduction：AN125 introduces MCU chip-level RE test methods and precautions to help users quickly understand chip-level RE test.

AN159 Chip-level ESD and System-level ESD Differences

1.0

none

2023-08-31

Introduction：AN159 describes the differences between MCU chip-level ESD and system-level ESD within test methods and test levels, helping users to clarify the irrelevance between chain-level ESD and system-level ESD.

AN065 FATFS file system porting based on GD32 MCU

Rev1.0

2023-08-28

Introduction：AN065 introduces how to port FATFS file system based on GD32 MCU.

AN128 IEC61000-4-4 System level EFT Test

1.0

2023-07-01

Introduction：AN128 introduces MCU system-level EFT test method, experiment implementation details and precautions to help users quickly understand the meaning of EFT parameters and test details in the datasheet.

AN127 IEC61000-4-2 System-Level ESD Test

1.0

2023-07-01

Introduction：AN127 introduces MCU system-level ESD test method, experiment implementation details and precautions to help users quickly understand the meaning of ESD parameters and test details in the datasheet.

AN089 GD32 TSI TouchKey Software Library User Guide

1.0

2023-06-02

Introduction：AN089 introduces the design principle and usage of TouchKey software library, which can help developers quickly use TouchKey software library for configuration and development.

AN064 Calibration method of internal low speed oscillator using TIMER

1.0

2022-08-23

Introduction：AN064 aims to describe the method of using TIMER to calibrate the low speed oscillator.