Application Note (22 in all)
Introduction：AN169 is used to introduce how to migrate from the GD32E230 series to the GD32E235 series, and related precautions.
Introduction：AN191 Introduces the Precautions to be Taken in the Hardware Layout of the GD32 MCU.
Introduction：AN181 introduces the I2C noise filter of the GD32 MCU and the calculation of related hold and setup times.
Introduction：AN092 is designed for engineering designers based on GD32 MCU development, and mainly introduces the functional configuration of GPIO, the internal structure, and the precautions when using in different scenarios
Introduction：AN192 describes how to use GD32 MCU for spreading frequency testing, and uses GD32F470 as an example to introduce the relevant operation steps and their impact.
Introduction：AN95 aims to guide customers on ways to improve the accuracy of GD32 MCU temperature sensors.
Introduction：AN074 is specially provided for MCU developers based on GD32E23x series, and provides an overall introduction to the hardware development of GD32E23x series products.
Introduction：AN196 mainly introduces that the MCU frequency is high, FLASH can be used to simulate EEPROM to reduce the cost. In this document, a method of simulating EEPROM with FLASH is introduced, which realizes the EEPROM data modification by byte, and can prevent the data lost by software reset or power reset.
Introduction：AN163 provides some EMC protection design references for MCU hardware design, aiming to help optimize the EMC performance of MCU in the product application process.
Introduction：AN146 is mainly used to introduce the differences between GD32E235 and GD32E230 series, including peripherals, electrical characteristics, etc.
Introduction：AN142 introduces the sources and some improvement methods of EMC in motors and their drive systems, helping users quickly understand and optimize key circuits in the drive system.
Introduction：AN164 introduces the principle of Dhrystone and the porting method on GD32 MCU.
Introduction：AN125 introduces MCU chip-level RE test methods and precautions to help users quickly understand chip-level RE test.
Introduction：AN159 describes the differences between MCU chip-level ESD and system-level ESD within test methods and test levels, helping users to clarify the irrelevance between chain-level ESD and system-level ESD.
Introduction：AN065 introduces how to port FATFS file system based on GD32 MCU.
Introduction：AN128 introduces MCU system-level EFT test method, experiment implementation details and precautions to help users quickly understand the meaning of EFT parameters and test details in the datasheet.
Introduction：AN127 introduces MCU system-level ESD test method, experiment implementation details and precautions to help users quickly understand the meaning of ESD parameters and test details in the datasheet.
Introduction：AN089 introduces the design principle and usage of TouchKey software library, which can help developers quickly use TouchKey software library for configuration and development.
Introduction：AN059 introduces the basic principle of GD32 SAR ADC, and introduces the methods to improve the ADC sampling accuracy from several aspects, such as theory and practical sampling.
Introduction：AN052 is designed to describe the principle and application notes of GD32 MCU resonator-based clock circuit ,so as to facilitate developers to more quickly realize the conversion from design scheme to actual circuit.
Introduction：AN064 aims to describe the method of using TIMER to calibrate the low speed oscillator.
Introduction：AN062 aims to introduce EMC principles and characteristics, provide recommendations for EMC application based on various application conditions.
@2024 ALL RIGHTS RESERVED
