Application Note (103 in all)
Introduction：AN179 introduces the characteristic differences between GD32L235 and GD32EL233 product series, mainly for electric characteristics and peripheral function characteristics.
Introduction：AN175 mainly introduces the GD32A503/A513 series ECC two-bit errors and common handling methods.
Introduction：AN201 mainly introduces that the MCU frequency is high, FLASH can be used to simulate EEPROM to reduce the cost. In this document, a method of simulating EEPROM with FLASH is introduced, which realizes the EEPROM data modification by byte, and can prevent the data lost by software reset or power reset.
Introduction：AN194 is used to introduce how to migrate from the GD32F4xx series to the GD32F5xx series, and related precautions.
Introduction：AN196 mainly introduces that the MCU frequency is high, FLASH can be used to simulate EEPROM to reduce the cost. In this document, a method of simulating EEPROM with FLASH is introduced, which realizes the EEPROM data modification by byte, and can prevent the data lost by software reset or power reset.
Introduction：AN163 provides some EMC protection design references for MCU hardware design, aiming to help optimize the EMC performance of MCU in the product application process.
Introduction：AN146 is mainly used to introduce the differences between GD32E235 and GD32E230 series, including peripherals, electrical characteristics, etc.
Introduction：AN166 mainly introduces the thermal characteristics and temperature management solutions for GD32H7 in high-performance, high-power-consumption scenarios.
Introduction：AN118 introduces the use process and method of GD32H7xx series Licensed Firmware Installation (LFI), and also introduces the operation process of related software.
Introduction：AN051 is designed to help users better solve ESD problems by choosing the right TVS model.
Introduction：AN186 is designed to help users to build and develop GD32VW553 series MCU project in SEGGER Embedded studio for RISC-V (SES) IDE.
Introduction：AN153 is used to guide customers to test the function and performance of Wi-Fi and BLE hardware and software systems based on UART commands on GD32VW553 series.
Introduction：AN154 is used to guide customers to quickly get started with Wi-Fi and BLE development on the corresponding development board of the GD32VW553 series, including the introduction of the development environment, SDK configuration, engineering compilation, and firmware download.
Introduction：AN142 introduces the sources and some improvement methods of EMC in motors and their drive systems, helping users quickly understand and optimize key circuits in the drive system.
Introduction：AN161 introduces the various frame formats of GD32F4xx series I2S+DMA communication methods and precautions.
Introduction：AN164 introduces the principle of Dhrystone and the porting method on GD32 MCU.
Introduction：AN167 describes the application configuration and operation of GD32L233 deep-sleep 2 mode to meet the application requirements of low power systems.
Introduction：GD32H7 Series Overview of Secure startup describes the Secure Boot Process, Secure Boot Code, Signature Verification Process, and User’s Boot Image Verification Process.
Introduction：AN125 introduces MCU chip-level RE test methods and precautions to help users quickly understand chip-level RE test.
Introduction：AN121 helps user fully understand security architecture of the GD32H7xx series MCU, including secure features, secure install and update solution, secure boot and secure mode.
Introduction：AN159 describes the differences between MCU chip-level ESD and system-level ESD within test methods and test levels, helping users to clarify the irrelevance between chain-level ESD and system-level ESD.
Introduction：AN065 introduces how to port FATFS file system based on GD32 MCU.
Introduction：AN113 introduces the knowledge of the GD32H7xx series secure storage management. To allow developers to quickly understand the security mode of the GD32H7xx and the use of basic security services.
Introduction：AN128 introduces MCU system-level EFT test method, experiment implementation details and precautions to help users quickly understand the meaning of EFT parameters and test details in the datasheet.
Introduction：AN127 introduces MCU system-level ESD test method, experiment implementation details and precautions to help users quickly understand the meaning of ESD parameters and test details in the datasheet.
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